Correction of backscattering effects in the quantification of Auger depth profilesBARKSHIRE, I. R; PRUTTON, M; SKINNER, D. K et al.Surface and interface analysis. 1991, Vol 17, Num 4, pp 213-218, issn 0142-2421, 6 p.Article

Si Auger electron spectra induced by noble gas ion bomardmentNADAL, G. H; GRIZZI, O; SANCHEZ, E. A et al.Journal of physics. Condensed matter (Print). 1993, Vol 5, Num 33A, pp A171-A172, issn 0953-8984, SUPConference Paper

Multielectron spectroscopy : The xenon 4d hole double auger decayPENENT, F; PALAUDOUX, J; LABLANQUIE, P et al.Physical review letters. 2005, Vol 95, Num 8, issn 0031-9007, 083002-1-083002-4Article

Electronic structure of metallic alloys through Auger electron spectroscopyKLEIMAN, G. G.Journal of physics. Condensed matter (Print). 1993, Vol 5, Num 33A, pp A167-A168, issn 0953-8984, SUPConference Paper

Direct evidence of Doppler shift in 10 keV Ar⁺ ion induced Si Auger emissionXU, F; SICILIANO, R; CAMARCA, M et al.Surface science. 1989, Vol 209, Num 1-2, pp L133-L137, issn 0039-6028Article

Influence of elastic diffusion of electrons on the Auger current formulation and the backscattering factorGRUZZA, B; PARISET, C.Journal of physics. D, Applied physics (Print). 1989, Vol 22, Num 5, pp 717-719, issn 0022-3727, 3 p.Article

Many-body effects at the Si L_2,3VV Auger line shape: the case of Ca silicidesSANCROTTI, M; ABBATI, I; CALLIARI, L et al.Physical review. B, Condensed matter. 1988, Vol 37, Num 9, pp 4805-4808, issn 0163-1829Article

High energy (∼ 107 eV) Si peak in Ar⁺ excited Auger emission from silicon and silicidesVALERI, S; TONINI, R.Surface science. 1989, Vol 220, Num 2-3, pp 407-418, issn 0039-6028, 12 p.Article

Cascade-induced asymmetry in Auger-electron emission following fast ion-solid interactionsSCHIWIETZ, G; SCHNEIDER, D; BIERSACK, J. P et al.Physical review letters. 1988, Vol 61, Num 23, pp 2677-2680, issn 0031-9007Article

Variation angulaire de la structure fine du spectre Auger du graphiteMIKHAJLOV, G. M; LISETSKIJ, E. M; KHRISTENKO, S. V et al.Fizika tverdogo tela. 1987, Vol 29, Num 7, pp 2186-2188, issn 0367-3294Article

Sensitivity factors for KL_2,3L_2,3 transitions for light elements in Auger electron spectroscopyJAIN, N. C.Journal of electron spectroscopy and related phenomena. 1989, Vol 48, Num 1-2, pp 203-208, issn 0368-2048Article

The past, present, and future of Auger line shape analysisRAMAKER, D. E.Critical reviews in solid state and materials sciences. 1991, Vol 17, Num 3, pp 211-276, issn 1040-8436Article

Chemical bonding in microcrystalline Si-H:Cl films studied by ion-induced Auger electron spectroscopyGROSSMAN, E; GRILL, A; POLAK, M et al.Thin solid films. 1989, Vol 173, Num 1, pp L109-L114, issn 0040-6090Article

Origin of Cu and ZnL₂- and L₃-M₄₅M₄₅ Auger satellites: breakdown of the sudden approximationSARMA, D. D; CARBONE, C; SEN, P et al.Physical review letters. 1989, Vol 63, Num 6, pp 656-659, issn 0031-9007, 4 p.Article

Auger microprobe-surface analysis of sub-μm nitrides and carbonitrides in steelHANTSCHE, H; SCHMIDT, D; GOLZE, M et al.Fresenius' journal of analytical chemistry. 1993, Vol 346, Num 1-3, pp 29-36, issn 0937-0633Conference Paper

Low-energy Auger electron diffraction: influence of multiple scattering and angular momentumCHASSE, A; NIEBERGALL, L; KUCHERENKO, Yu et al.Surface science. 2002, Vol 501, Num 3, pp 244-252, issn 0039-6028Article

Fractionation of sulfur-containing compounds in oxidized diesel fuel : Use of activated silica gel in sample preparationBONDE, S. E; STROOP, D.Preprints - American Chemical Society. Division of Petroleum Chemistry. 2000, Vol 45, Num 1, pp 54-55, issn 0569-3799Conference Paper

Production and radiochemical separation of the Auger electron emitter 140NdRÖSCH, Frank; BROCKMANN, Jörg; LEBEDEV, Nikolai A et al.Acta oncologica (Stockholm). 2000, Vol 39, Num 6, pp 727-730, issn 0284-186XConference Paper

Comparison of accuracy of various AES methods for quantitative analysis of refractory metal silicidesZAGORENKO, A. I; ZAPOROZCHENKO, V. I.Surface and interface analysis. 1991, Vol 17, Num 5, pp 237-244, issn 0142-2421Article

Material dependence of multiple-scattering effects associated with photoelectron and auger electron diffraction along atomic chainsAEBISCHER, H. A; GREBER, T; OSTERWALDER, J et al.Surface science. 1990, Vol 239, Num 3, pp 261-264, issn 0039-6028, 4 p.Article

The superposition of carbon and ruthenium auger spectraVAN STADEN, M. J; ROUX, J. P.Applied surface science. 1990, Vol 44, Num 4, pp 259-262, issn 0169-4332, 4 p.Article

Effet getter dans le silicium poly- et bicristallin : interaction de l'or et de l'oxygène avec les impuretés métalliques = Gettering effects in silicon poly and bicrystals: interaction of gold and oxygen with metal impuritiesAMARRAY, Elhoussine; BURGGRAF, Charles.1986, 132 pThesis

L_2,3M_4,5M_4,5 x-ray-excited Auger-electron spectra of In, Sn, and SbKLEIMAN, G. G; LANDERS, R; NASCENTE, P. A. P et al.Physical review. B, Condensed matter. 1992, Vol 46, Num 4, pp 1970-1974, issn 0163-1829Article

Auger electron intensity variations in oxygen-charged silverLEE, W. S; OUTLAW, R. A; HOFLUND, G. B et al.Applied surface science. 1991, Vol 47, Num 1, pp 91-98, issn 0169-4332, 8 p.Article

Background removal in AES ; Influence of detection geometrical characteristicsROSENBERG, N; THOLOMIER, M; VICARIO, E et al.Surface and interface analysis. 1991, Vol 17, Num 8, pp 575-583, issn 0142-2421, 9 p.Article